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    • Investigating 3D Printer Residual Data 

      Miller, Daniel Bradford; Gatlin, Jacob; Glisson, William Bradley; Yampolskiy, Mark; McDonald, Jeffery Todd (Proceedings of the 52nd Hawaii International Conference on System Sciences, 2019-01)
      The continued adoption of Additive Manufacturing (AM) technologies is raising concerns in the security, forensics, and intelligence gathering communities. These concerns range from identifying and mitigating compromised ...