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dc.contributor.authorMiller, Daniel Bradford
dc.contributor.authorGatlin, Jacob
dc.contributor.authorGlisson, William Bradley
dc.contributor.authorYampolskiy, Mark
dc.contributor.authorMcDonald, Jeffery Todd
dc.date.accessioned2021-09-24T21:10:52Z
dc.date.available2021-09-24T21:10:52Z
dc.date.issued2019-01
dc.identifier.citationMiller, D., Gatlin, J., Glisson, W., Yampolskiy, M., & McDonald, J. (2019). Investigating 3D Printer Residual Data. Proceedings of the 52nd Hawaii International Conference on System Sciences. Hawaii International Conference on System Sciences, p. 7176-7185. https://doi.org/10.24251/hicss.2019.861en_US
dc.identifier.urihttps://hdl.handle.net/20.500.11875/3205
dc.descriptionA paper co-authored by William Glisson and published in the Proceedings of the 52nd Hawaii International Conference on System Sciences in 2019.en_US
dc.description.abstractThe continued adoption of Additive Manufacturing (AM) technologies is raising concerns in the security, forensics, and intelligence gathering communities. These concerns range from identifying and mitigating compromised devices, to theft of intellectual property, to sabotage, to the production of prohibited objects. Previous research has provided insight into the retrieval of configuration information maintained on the devices, but this work shows that the devices can additionally maintain information about the print process. Comparisons between before and after images taken from an AM device reveal details about the device’s activities, including printed designs, menu interactions, and the print history. Patterns in the storage of that information also may be useful for reducing the amount of data that needs to be examined during an investigation. These results provide a foundation for future investigations regarding the tools and processes suitable for examining these devices.en_US
dc.publisherProceedings of the 52nd Hawaii International Conference on System Sciencesen_US
dc.subjectCyber Threat Intelligence and Analyticsen_US
dc.subjectSoftware Technologyen_US
dc.subjectAdditive Manufacturing, Embedded Systems, Forensicsen_US
dc.titleInvestigating 3D Printer Residual Dataen_US
dc.typeArticleen_US


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